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中国科学院自动化研究所机构知识库
Knowledge Commons of Institute of Automation，CAS
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Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey
期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
Authors:
Tao, Xian
;
Gong, Xinyi
;
Zhang, Xin
;
Yan, Shaohua
;
Adak, Chandranath
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View/Download：44/0
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Submit date：2022/09/19
Anomaly localization (AL)
deep learning
industrial inspection
literature survey
unsupervised learning
Unsupervised Anomaly Detection for Surface Defects with Dual-Siamese Network
期刊论文
IEEE Transactions on Industrial Informatics, 2022, 卷号: 1, 期号: 1, 页码: 1-11
Authors:
Tao X(陶显)
;
Da-Peng Zhang
;
Ma WZ(马文治)
;
Hou ZX(侯占新)
;
Lu ZF(逯正峰)
;
Chandranath Adak
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View/Download：74/8
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Submit date：2022/03/03
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