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Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
Authors:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Favorite  |  View/Download:205/0  |  Submit date:2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Unsupervised Anomaly Detection for Surface Defects with Dual-Siamese Network 期刊论文
IEEE Transactions on Industrial Informatics, 2022, 卷号: 1, 期号: 1, 页码: 1-11
Authors:  Tao X(陶显);  Da-Peng Zhang;  Ma WZ(马文治);  Hou ZX(侯占新);  Lu ZF(逯正峰);  Chandranath Adak
Adobe PDF(8384Kb)  |  Favorite  |  View/Download:236/52  |  Submit date:2022/03/03
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