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Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载：279/5  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Cross-domain few-shot learning approach for lithium-ion battery surface defects classification using an improved siamese network 期刊论文
IEEE SENSORS JOURNAL, 2022, 页码: 1-1
作者:  Wu, Ke;  Tan, Jie;  Liu, Cheng Bao
Adobe PDF(5175Kb)  |  收藏  |  浏览/下载：348/125  |  提交时间：2022/06/14
Few-shot Learning  3D measurement  defect detection  image classification  
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：316/67  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection  
Attention-guided Unified Network for Panoptic Segmentation 会议论文
, 美国长滩, 2019.6.16-2019.6.20
作者:  Li, Yanwei;  Chen, Xinze;  Zhu, Zheng;  Xie, Lingxi;  Huang, Guan;  Du, Dalong;  Wang, Xingang
浏览  |  Adobe PDF(3076Kb)  |  收藏  |  浏览/下载：202/81  |  提交时间：2020/06/10