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Cross-domain few-shot learning approach for lithium-ion battery surface defects classification using an improved siamese network 期刊论文
IEEE SENSORS JOURNAL, 2022, 页码: 1-1
作者:  Wu, Ke;  Tan, Jie;  Liu, Cheng Bao
Adobe PDF(5175Kb)  |  收藏  |  浏览/下载：334/122  |  提交时间：2022/06/14
Few-shot Learning  3D measurement  defect detection  image classification  
Generalization on Unseen Domains via Model-Agnostic Learning for Intelligent Fault Diagnosis 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 11
作者:  Wang, Huanjie;  Bai, Xiwei;  Wang, Sihan;  Tan, Jie;  Liu, Chengbao
Adobe PDF(3477Kb)  |  收藏  |  浏览/下载：298/55  |  提交时间：2022/06/06
Data-driven fault diagnosis  Domain generalization  Model-agnostic learning  Rolling bearing  
Directional Deep Embedding and Appearance Learning for Fast Video Object Segmentation 期刊论文
IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS, 2021, 页码: 11
作者:  Yin, Yingjie;  Xu, De;  Wang, Xingang;  Zhang, Lei
收藏  |  浏览/下载：201/0  |  提交时间：2022/02/16
Feature extraction  Kernel  Object segmentation  Faces  Probabilistic logic  Learning systems  Image segmentation  Deep appearance learning  directional deep embedding learning  directional statistics-based learning  video object segmentation (VOS)  
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：299/66  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection  
A Self-Supervised CNN for Particle Inspection on Optical Element 期刊论文
IEEE Transactions on Instrumentation and Measurement, 2021, 卷号: 70, 期号: 1, 页码: 1-12
作者:  Hou W(侯伟);  Tao X(陶显);  Xu D(徐德)
Adobe PDF(2721Kb)  |  收藏  |  浏览/下载：274/66  |  提交时间：2021/06/21
Inspection  Feature reuse  optical element  particle inspection  self-supervised learning  transfer learning