CASIA OpenIR

浏览/检索结果: 共6条,第1-6条 帮助

限定条件                        
已选(0)清除 条数/页:   排序方式:
Uncertainty quantification of bearing remaining useful life based on convolutional neural network 会议论文
, Canberra, Australia, 2020-12
作者:  Wang Huanjie;  Bai Xiwei;  Tan, Jie
Adobe PDF(952Kb)  |  收藏  |  浏览/下载:148/53  |  提交时间:2023/05/31
CADN: A weakly supervised learning-based category-aware object detection network for surface defect detection 期刊论文
Pattern Recognition, 2020, 期号: 109, 页码: 1-9
作者:  Jiabin, Zhang;  Hu, Su;  Wei, Zou;  Xinyi, Gong;  Zhengtao, Zhang;  Fei, Shen
Adobe PDF(1838Kb)  |  收藏  |  浏览/下载:233/46  |  提交时间:2021/06/17
Weakly supervised learning  Automated surface inspection  Defect detection  Knowledge distillation  
Combination of Convolutional Neural Networks and Recurrent Neural Networks for predicting soil properties using Vis–NIR spectroscopy 期刊论文
Geoderma, 2020, 期号: 380, 页码: 114616
作者:  杨杰超;  王学雷;  王瑞华;  王焕杰
Adobe PDF(4483Kb)  |  收藏  |  浏览/下载:230/61  |  提交时间:2021/05/28
Vis–NIR spectroscopy  Convolutional Neural Network  Recurrent Neural Network  Soil properties estimation  
CADN: A weakly supervised learning-based category-aware object detection network for surface defect detection 期刊论文
Pattern Recognition, 2020, 卷号: 109, 期号: 0, 页码: 10
作者:  Zou W(邹伟)
浏览  |  Adobe PDF(1839Kb)  |  收藏  |  浏览/下载:181/53  |  提交时间:2020/10/22
Weakly supervised learning, Automated surface inspection, Defect detection, Knowledge distillation  
Probabilistic Prediction of Solar Generation Based on Stacked Autoencoder and Lower Upper Bound Estimation Method 会议论文
, 线上, 19 – 24th July, 2020
作者:  Pan, Cheng;  Tan, Jie
Adobe PDF(1379Kb)  |  收藏  |  浏览/下载:222/66  |  提交时间:2020/09/25
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载:382/83  |  提交时间:2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing