中文版 | English

在结果中检索

CASIA OpenIR

浏览/检索结果: 共5条，第1-5条 帮助

限定条件                        
已选(0)清除 条数/页：   排序方式：
Region Probability Map-Guided Fast Wide-Area Multiobject Detection 期刊论文
IEEE Transactions on Instrumentation and Measurement, 2022, 页码: 1-12
作者:  Long XL(龙宪磊);  Chen, Mengjuan;  Li, Zhikai;  Gu, Qingyi
Adobe PDF(9818Kb)  |  收藏  |  浏览/下载：271/48  |  提交时间：2022/12/19
High-speed vision  object detection  particle filter  region probability map  wide-area surveillance  
Mechanical Particle Filter-Based Active Vision System for Fast Wide-Area Multiobject Detection 期刊论文
IEEE Transactions on Instrumentation and Measurement, 2022, 卷号: 71, 页码: 1-13
作者:  Long XL(龙宪磊);  Ma, Liping;  Jiang, He;  Li, Zhikai;  Chen, Yunze;  Gu, Qingyi
Adobe PDF(4989Kb)  |  收藏  |  浏览/下载：307/56  |  提交时间：2022/12/19
High-speed vision , mechanical particle filter (MPF) , object detection , visual feedback , wide-area surveillance  
Gait Pattern Identification and Phase Estimation in Continuous Multilocomotion Mode Based on Inertial Measurement Units 期刊论文
IEEE SENSORS JOURNAL, 2022, 卷号: 22, 期号: 17, 页码: 16952-16962
作者:  Zhang, Xingxuan;  Zhang, Haojian;  Hu, Jianhua;  Zheng, Jun;  Wang, Xinbo;  Deng, Jieren;  Wan, Zihao;  Wang, Haotian;  Wang, Yunkuan
Adobe PDF(9495Kb)  |  收藏  |  浏览/下载：341/38  |  提交时间：2022/11/14
Gait pattern identification  phase estimate  adaptive oscillators  gait event detector  wearable robots  
CellNet: A Lightweight Model towards Accurate LOC-Based High-Speed Cell Detection 期刊论文
ELECTRONICS, 2022, 卷号: 11, 期号: 9, 页码: 20
作者:  Long, Xianlei;  Ishii, Idaku;  Gu, Qingyi
Adobe PDF(1681Kb)  |  收藏  |  浏览/下载：397/171  |  提交时间：2022/07/25
cell detection  high-speed vision  convolutional neural network (CNN)  efficient convolutional block  medical image analysis  
Cross-domain few-shot learning approach for lithium-ion battery surface defects classification using an improved siamese network 期刊论文
IEEE SENSORS JOURNAL, 2022, 页码: 1-1
作者:  Wu, Ke;  Tan, Jie;  Liu, Cheng Bao
Adobe PDF(5175Kb)  |  收藏  |  浏览/下载：337/122  |  提交时间：2022/06/14
Few-shot Learning  3D measurement  defect detection  image classification