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Online Progressive Instance-Balanced Sampling for Weakly Supervised Vibration Damper Detection 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 14
作者:  Chen, Minghao;  Tian, Yunong;  Li, Zhishuo;  Li, En;  Liang, Zize
Adobe PDF(4445Kb)  |  收藏  |  浏览/下载：139/22  |  提交时间：2023/11/17
Shock absorbers  Vibrations  Object detection  Proposals  Training  Sampling methods  Convolutional neural networks  Instance balance  multiple instance learning (MIL)  progressive sampling  vibration damper detection  weakly supervised object detection (WSOD)  
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载：288/8  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Hardware-Oriented Algorithm for High-Speed Laser Centerline Extraction Based on Hessian Matrix 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 14
作者:  Li, Zhikai;  Ma, Liping;  Long, Xianlei;  Chen, Yunze;  Deng, Haitao;  Yan, Fengxia;  Gu, Qingyi
Adobe PDF(3764Kb)  |  收藏  |  浏览/下载：350/56  |  提交时间：2022/03/17
Hardware image processing  Hessian matrix  high-speed vision  laser centerline extraction  line-section 3-D reconstruction  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：281/65  |  提交时间：2022/03/03
缺陷检测  
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：329/70  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection