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A Streamlined 3-D Magnetic Particle Imaging System With a Two-Stage Excitation Feed-Through Compensation Strategy 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 1-10
作者:  Yin L(尹琳);  Li W(李玮);  Bian ZW(卞忠伟);  Chen ZW(陈梓威);  Liu YJ(刘晏君);  Zhong J(钟景);  Zhang SX(张水兴);  Du Y(杜洋);  Hui H(惠辉);  Tian J(田捷)
Adobe PDF(3893Kb)  |  收藏  |  浏览/下载：52/23  |  提交时间：2024/03/26
3-D imaging  compensation strategy  magnetic particle imaging (MPI)  
Image-Based Visual Servoing System for Components Alignment Using Point and Line Features 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 11
作者:  Yan, Shaohua;  Tao, Xian;  Xu, De
Adobe PDF(1856Kb)  |  收藏  |  浏览/下载：213/4  |  提交时间：2022/06/10
Deep neural network  feature extraction  image-based visual servoing  interaction matrix  pose error estimation  robotic assembly system  
An Underwater Micro Cable-Driven Pan-Tilt Binocular Vision System With Spherical Refraction Calibration 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Qiu, Changlin;  Wu, Zhengxing;  Kong, Shihan;  Yu, Junzhi
Adobe PDF(2362Kb)  |  收藏  |  浏览/下载：168/4  |  提交时间：2021/11/04
Pan-tilt camera  target tracking  underwater measurement  underwater refraction correction  
Combining Prior Knowledge With CNN for Weak Scratch Inspection of Optical Components 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 11
作者:  Hou, Wei;  Tao, Xian;  Xu, De
Adobe PDF(6798Kb)  |  收藏  |  浏览/下载：387/131  |  提交时间：2021/03/08
Convolutional neural network (CNN)  direction-sensitive convolution (DSC)  local maximum index (LMI)  optical component  weak scratch inspection  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：350/73  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing