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Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：268/63  |  提交时间：2022/03/03
缺陷检测  
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：312/67  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection  
A novel approach to obtain optimal exposure for 3D shape reconstruction of high dynamic range objects 期刊论文
Measurement Science and Technology, 2021, 卷号: 32, 期号: 9, 页码: 1-1
作者:  Wu,Ke;  Tan,Jie;  Liu,Chengbao
Adobe PDF(18867Kb)  |  收藏  |  浏览/下载：309/45  |  提交时间：2021/08/15
structured light  fringe projection  3D reconstruction  auto-exposure  
Industrial Weak Scratches Inspection Based on Multifeature Fusion Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 14
作者:  Tao, Xian;  Zhang, Dapeng;  Hou, Wei;  Ma, Wenzhi;  Xu, De
Adobe PDF(11203Kb)  |  收藏  |  浏览/下载：407/57  |  提交时间：2021/03/08
Deep learning  defect detection  machine vision  multiple feature fusion  weak scratch inspection