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A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：297/65  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：357/74  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing  
Surface Defects Detection Based on Adaptive Multiscale Image Collection and Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 卷号: 68, 期号: 12, 页码: 4787-4797
作者:  Sun, Jia;  Wang, Peng;  Luo, Yong-Kang;  Li, Wanyi
Adobe PDF(4530Kb)  |  收藏  |  浏览/下载：270/87  |  提交时间：2020/03/30
Inspection  Surface treatment  Training  Metals  Task analysis  Instruments  Visualization  Adaptive multiscale image collection (AMIC)  convolutional neural networks (CNNs)  image classification  surface inspection