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Learning Multi-Resolution Features for Unsupervised Anomaly Localization on Industrial Textured Surfaces 期刊论文
IEEE Transactions on Artificial Intelligence, 2024, 页码: 1-13
作者:  Tao X(陶显);  Shaohua Yan;  Xinyi Gong;  Chandranath Adak
Adobe PDF(6034Kb)  |  收藏  |  浏览/下载：43/13  |  提交时间：2024/06/04
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载：277/5  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：270/63  |  提交时间：2022/03/03
缺陷检测  
Industrial Weak Scratches Inspection Based on Multifeature Fusion Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 14
作者:  Tao, Xian;  Zhang, Dapeng;  Hou, Wei;  Ma, Wenzhi;  Xu, De
Adobe PDF(11203Kb)  |  收藏  |  浏览/下载：413/60  |  提交时间：2021/03/08
Deep learning  defect detection  machine vision  multiple feature fusion  weak scratch inspection  
Industrial WeakScratches Inspection Based on Multi-Feature Fusion Network 期刊论文
IEEE Transaction on Instrumentation and Measurement, 2020, 期号: 1, 页码: 1-14
作者:  Tao Xian;  Zhang DP(张大朋);  Hou wei;  Ma wenzhi;  Xu De
浏览  |  Adobe PDF(5789Kb)  |  收藏  |  浏览/下载：282/71  |  提交时间：2020/10/20
Weak scratch inspection, Defect Detection, MultipleFeatureFusion,DeepLearning,MachineVision  
An overview of contour detection approaches 期刊论文
International Journal of Automation and Computing, 2018, 卷号: 15, 期号: 6, 页码: 656-672
作者:  Gong XY(宫新一);  Hu Su;  De Xu;  Zhengtao Zhang;  Fei Shen;  Huabin Yang
浏览  |  Adobe PDF(8437Kb)  |  收藏  |  浏览/下载：640/195  |  提交时间：2019/05/08
Contour Detection, Contour Salience, Gestalt Principle, Contour Grouping, Active Contour