中文版 | English

在结果中检索

CASIA OpenIR
（本次检索基于用户作品认领结果）

浏览/检索结果: 共5条，第1-5条 帮助

限定条件                                
已选(0)清除 条数/页：   排序方式：
Investigating Shift Equivalence of Convolutional Neural Networks in Industrial Defect Segmentation 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 页码: 1-17
作者:  Qu Z(屈震);  Tao X(陶显);  Shen F(沈飞);  Zhang ZT(张正涛);  Li T(李涛)
Adobe PDF(2869Kb)  |  收藏  |  浏览/下载：45/19  |  提交时间：2024/06/04
Image-Based Visual Servoing System for Components Alignment Using Point and Line Features 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 11
作者:  Yan, Shaohua;  Tao, Xian;  Xu, De
Adobe PDF(1856Kb)  |  收藏  |  浏览/下载：255/18  |  提交时间：2022/06/10
Deep neural network  feature extraction  image-based visual servoing  interaction matrix  pose error estimation  robotic assembly system  
High-precision robotic assembly system using three-dimensional vision 期刊论文
INTERNATIONAL JOURNAL OF ADVANCED ROBOTIC SYSTEMS, 2021, 卷号: 18, 期号: 3, 页码: 12
作者:  Yan, Shaohua;  Tao, Xian;  Xu, De
Adobe PDF(1740Kb)  |  收藏  |  浏览/下载：283/22  |  提交时间：2021/11/03
3D vision  feature extraction  pose estimation  hybrid visual servoing  robotic assembly system  
Wire Defect Recognition of Spring-Wire Socket Using Multitask Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 卷号: 8, 期号: 4, 页码: 689-698
作者:  Tao, Xian;  Wang, Zihao;  Zhang, Zhengtao;  Zhang, Dapeng;  Xu, De;  Gong, Xinyi;  Zhang, Lei
浏览  |  Adobe PDF(4279Kb)  |  收藏  |  浏览/下载：532/199  |  提交时间：2018/10/02
Convolutional Neural Network (Cnn)  Defect Recognition  Machine Vision  Multitask Learning  Spring-wire Sockets  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：579/156  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning