中文版 | English

在结果中检索

CASIA OpenIR

浏览/检索结果: 共5条，第1-5条 帮助

限定条件            
已选(0)清除 条数/页：   排序方式：
Hardware-Oriented Algorithm for High-Speed Laser Centerline Extraction Based on Hessian Matrix 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 14
作者:  Li, Zhikai;  Ma, Liping;  Long, Xianlei;  Chen, Yunze;  Deng, Haitao;  Yan, Fengxia;  Gu, Qingyi
Adobe PDF(3764Kb)  |  收藏  |  浏览/下载：279/40  |  提交时间：2022/03/17
Hardware image processing  Hessian matrix  high-speed vision  laser centerline extraction  line-section 3-D reconstruction  
An Underwater Micro Cable-Driven Pan-Tilt Binocular Vision System With Spherical Refraction Calibration 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Qiu, Changlin;  Wu, Zhengxing;  Kong, Shihan;  Yu, Junzhi
Adobe PDF(2362Kb)  |  收藏  |  浏览/下载：158/0  |  提交时间：2021/11/04
Pan-tilt camera  target tracking  underwater measurement  underwater refraction correction  
A Calibration and 3-D Measurement Method for an Active Vision System With Symmetric Yawing Cameras 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Xu, De;  Zhang, Di;  Liu, Xilong;  Ma, Liping
Adobe PDF(2707Kb)  |  收藏  |  浏览/下载：299/55  |  提交时间：2021/11/03
3-D measurement  active vision  calibration  stereo vision  symmetric yawing system  
Combining Prior Knowledge With CNN for Weak Scratch Inspection of Optical Components 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 11
作者:  Hou, Wei;  Tao, Xian;  Xu, De
Adobe PDF(6798Kb)  |  收藏  |  浏览/下载：380/130  |  提交时间：2021/03/08
Convolutional neural network (CNN)  direction-sensitive convolution (DSC)  local maximum index (LMI)  optical component  weak scratch inspection  
Industrial Weak Scratches Inspection Based on Multifeature Fusion Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 14
作者:  Tao, Xian;  Zhang, Dapeng;  Hou, Wei;  Ma, Wenzhi;  Xu, De
Adobe PDF(11203Kb)  |  收藏  |  浏览/下载：362/50  |  提交时间：2021/03/08
Deep learning  defect detection  machine vision  multiple feature fusion  weak scratch inspection