中文版 | English

在结果中检索

CASIA OpenIR

浏览/检索结果: 共4条，第1-4条 帮助

限定条件        
已选(0)清除 条数/页：   排序方式：
Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 12
作者:  Fu, Xiang;  Yang, Yuting;  Sun, Zhenhuan;  Su, Hu;  Li, Youfu;  Li, Teng;  Liu, Song
收藏  |  浏览/下载：81/0  |  提交时间：2023/12/21
Dynamic visual tracking  motion distortion removal  nanomanipulation  scanning electron microscope (SEM) image denoising  
Design and Hysteresis Modeling of a Miniaturized Elastomer-Based Clutched Torque Sensor 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 9
作者:  Sun, Ning;  Cheng, Long;  Xia, Xiuze
Adobe PDF(1608Kb)  |  收藏  |  浏览/下载：362/96  |  提交时间：2022/06/06
Clutch  elastic torque sensor  hysteresis modeling  mechanical design  rubber spring  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：239/56  |  提交时间：2022/03/03
缺陷检测  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：545/145  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning