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Dual-Branch Learning With Prior Information for Surface Anomaly Detection 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 11
作者:  Wang, Shuyuan;  Lv, Chengkan;  Zhang, Zhengtao;  Wei, Xueyan
收藏  |  浏览/下载：98/0  |  提交时间：2023/11/16
Image reconstruction  Decoding  Anomaly detection  Training data  Feature extraction  Surface reconstruction  Training  anomaly escape  defect detection  dual-branch (DB) autoencoder (AE)  gated attention (GA)  overkill  
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
收藏  |  浏览/下载：233/0  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：278/62  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：339/71  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing  
Surface Defects Detection Based on Adaptive Multiscale Image Collection and Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 卷号: 68, 期号: 12, 页码: 4787-4797
作者:  Sun, Jia;  Wang, Peng;  Luo, Yong-Kang;  Li, Wanyi
浏览  |  Adobe PDF(4530Kb)  |  收藏  |  浏览/下载：260/82  |  提交时间：2020/03/30
Inspection  Surface treatment  Training  Metals  Task analysis  Instruments  Visualization  Adaptive multiscale image collection (AMIC)  convolutional neural networks (CNNs)  image classification  surface inspection