CASIA OpenIR
(本次检索基于用户作品认领结果)

浏览/检索结果: 共5条,第1-5条 帮助

限定条件                        
已选(0)清除 条数/页:   排序方式:
A High Precision and Fast Alignment Method based on Binocular Vision 期刊论文
INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2022, 卷号: 0, 页码: 0
作者:  Gao H(高晗);  Shen F(沈飞);  Zhang F(张峰);  Zhang ZT(张正涛)
Adobe PDF(1579Kb)  |  收藏  |  浏览/下载:298/92  |  提交时间:2022/06/28
Visual Alignment, Binocular Vision, Camera Calibration, Image Processing  
Wire Defect Recognition of Spring-Wire Socket Using Multitask Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 卷号: 8, 期号: 4, 页码: 689-698
作者:  Tao, Xian;  Wang, Zihao;  Zhang, Zhengtao;  Zhang, Dapeng;  Xu, De;  Gong, Xinyi;  Zhang, Lei
浏览  |  Adobe PDF(4279Kb)  |  收藏  |  浏览/下载:530/198  |  提交时间:2018/10/02
Convolutional Neural Network (Cnn)  Defect Recognition  Machine Vision  Multitask Learning  Spring-wire Sockets  
Methods of Depth Measurement and Image Fusion Based on Multi-focus Micro-images 会议论文
25th Chinese Control and Decision Conference (CCDC), Guiyang, 25-27 May 2013
作者:  Yin YingJie;  Wang, Xingang;  Xu, De;  Zhang, Zhengtao;  Bai, Mingran
浏览  |  Adobe PDF(498Kb)  |  收藏  |  浏览/下载:383/88  |  提交时间:2016/06/20
Depth Measurement  Depth Of Field  Image Fusion  Micro-image  Multi-focus  Sharpness Evaluation Function  
Precision Assembly Among Multiple Thin Objects With Various Fit Types 期刊论文
IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2016, 卷号: 21, 期号: 1, 页码: 364-378
作者:  Xing, Dengpeng;  Xu, De;  Liu, Fangfang;  Li, Haipeng;  Zhang, Zhengtao
浏览  |  Adobe PDF(1288Kb)  |  收藏  |  浏览/下载:477/116  |  提交时间:2016/06/14
Motion Control  Precision Assembly  Various Fit Types  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载:575/154  |  提交时间:2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning