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Visual Tracking With Motion Distortion Removal for Nanomanipulation Inside SEM 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 12
作者:  Fu, Xiang;  Yang, Yuting;  Sun, Zhenhuan;  Su, Hu;  Li, Youfu;  Li, Teng;  Liu, Song
收藏  |  浏览/下载：86/0  |  提交时间：2023/12/21
Dynamic visual tracking  motion distortion removal  nanomanipulation  scanning electron microscope (SEM) image denoising  
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载：249/0  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Design and Hysteresis Modeling of a Miniaturized Elastomer-Based Clutched Torque Sensor 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 9
作者:  Sun, Ning;  Cheng, Long;  Xia, Xiuze
Adobe PDF(1608Kb)  |  收藏  |  浏览/下载：383/103  |  提交时间：2022/06/06
Clutch  elastic torque sensor  hysteresis modeling  mechanical design  rubber spring  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：244/57  |  提交时间：2022/03/03
缺陷检测  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：551/146  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning