中文版 | English

在结果中检索

CASIA OpenIR

浏览/检索结果: 共4条，第1-4条 帮助

限定条件    
已选(0)清除 条数/页：   排序方式：
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：235/56  |  提交时间：2022/03/03
缺陷检测  
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：278/62  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：339/71  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing  
A Robust Detection Method of Control Points for Calibration and Measurement With Defocused Images 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2017, 卷号: 66, 期号: 10, 页码: 2725-2735
作者:  Ding, Wendong;  Liu, Xilong;  Xu, De;  Zhang, Dapeng;  Zhang, Zhengtao
浏览  |  Adobe PDF(2118Kb)  |  收藏  |  浏览/下载：496/119  |  提交时间：2018/01/04
Camera Calibration  Control Point Detection  Defocused Image  Point Spread Function  Vision Measurement