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Online Progressive Instance-Balanced Sampling for Weakly Supervised Vibration Damper Detection 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 14
作者:  Chen, Minghao;  Tian, Yunong;  Li, Zhishuo;  Li, En;  Liang, Zize
Adobe PDF(4445Kb)  |  收藏  |  浏览/下载：129/19  |  提交时间：2023/11/17
Shock absorbers  Vibrations  Object detection  Proposals  Training  Sampling methods  Convolutional neural networks  Instance balance  multiple instance learning (MIL)  progressive sampling  vibration damper detection  weakly supervised object detection (WSOD)  
Unsupervised Anomaly Detection for Surface Defects with Dual-Siamese Network 期刊论文
IEEE Transactions on Industrial Informatics, 2022, 卷号: 1, 期号: 1, 页码: 1-11
作者:  Tao X(陶显);  Da-Peng Zhang;  Ma WZ(马文治);  Hou ZX(侯占新);  Lu ZF(逯正峰);  Chandranath Adak
Adobe PDF(8384Kb)  |  收藏  |  浏览/下载：301/70  |  提交时间：2022/03/03
缺陷检测  
A Self-Supervised CNN for Particle Inspection on Optical Element 期刊论文
IEEE Transactions on Instrumentation and Measurement, 2021, 卷号: 70, 期号: 1, 页码: 1-12
作者:  Hou W(侯伟);  Tao X(陶显);  Xu D(徐德)
Adobe PDF(2721Kb)  |  收藏  |  浏览/下载：294/71  |  提交时间：2021/06/21
Inspection  Feature reuse  optical element  particle inspection  self-supervised learning  transfer learning  
EDDs: A series of Efficient Defect Detectors for fabric quality inspection 期刊论文
MEASUREMENT, 2021, 卷号: 172, 期号: 1, 页码: 8
作者:  Zhou, Tong;  Zhang, Jiabin;  Su, Hu;  Zou, Wei;  Zhang, Bohao
Adobe PDF(1132Kb)  |  收藏  |  浏览/下载：345/66  |  提交时间：2021/04/21
Defect detection  Convolutional neural network  Fabric quality inspection  Feature fusion  
Combining Prior Knowledge With CNN for Weak Scratch Inspection of Optical Components 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 11
作者:  Hou, Wei;  Tao, Xian;  Xu, De
Adobe PDF(6798Kb)  |  收藏  |  浏览/下载：413/136  |  提交时间：2021/03/08
Convolutional neural network (CNN)  direction-sensitive convolution (DSC)  local maximum index (LMI)  optical component  weak scratch inspection  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：379/82  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing