中文版 | English

在结果中检索

CASIA OpenIR

浏览/检索结果: 共4条，第1-4条 帮助

限定条件        
已选(0)清除 条数/页：   排序方式：
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载：263/1  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Hardware-Oriented Algorithm for High-Speed Laser Centerline Extraction Based on Hessian Matrix 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 14
作者:  Li, Zhikai;  Ma, Liping;  Long, Xianlei;  Chen, Yunze;  Deng, Haitao;  Yan, Fengxia;  Gu, Qingyi
Adobe PDF(3764Kb)  |  收藏  |  浏览/下载：311/45  |  提交时间：2022/03/17
Hardware image processing  Hessian matrix  high-speed vision  laser centerline extraction  line-section 3-D reconstruction  
A Calibration and 3-D Measurement Method for an Active Vision System With Symmetric Yawing Cameras 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Xu, De;  Zhang, Di;  Liu, Xilong;  Ma, Liping
Adobe PDF(2707Kb)  |  收藏  |  浏览/下载：324/62  |  提交时间：2021/11/03
3-D measurement  active vision  calibration  stereo vision  symmetric yawing system  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：558/148  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning