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A Streamlined 3-D Magnetic Particle Imaging System With a Two-Stage Excitation Feed-Through Compensation Strategy 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 1-10
作者:  Yin L(尹琳);  Li W(李玮);  Bian ZW(卞忠伟);  Chen ZW(陈梓威);  Liu YJ(刘晏君);  Zhong J(钟景);  Zhang SX(张水兴);  Du Y(杜洋);  Hui H(惠辉);  Tian J(田捷)
Adobe PDF(3893Kb)  |  收藏  |  浏览/下载：53/24  |  提交时间：2024/03/26
3-D imaging  compensation strategy  magnetic particle imaging (MPI)  
Hardware-Oriented Algorithm for High-Speed Laser Centerline Extraction Based on Hessian Matrix 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 14
作者:  Li, Zhikai;  Ma, Liping;  Long, Xianlei;  Chen, Yunze;  Deng, Haitao;  Yan, Fengxia;  Gu, Qingyi
Adobe PDF(3764Kb)  |  收藏  |  浏览/下载：297/43  |  提交时间：2022/03/17
Hardware image processing  Hessian matrix  high-speed vision  laser centerline extraction  line-section 3-D reconstruction  
Combining Prior Knowledge With CNN for Weak Scratch Inspection of Optical Components 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 11
作者:  Hou, Wei;  Tao, Xian;  Xu, De
Adobe PDF(6798Kb)  |  收藏  |  浏览/下载：394/133  |  提交时间：2021/03/08
Convolutional neural network (CNN)  direction-sensitive convolution (DSC)  local maximum index (LMI)  optical component  weak scratch inspection  
Industrial Weak Scratches Inspection Based on Multifeature Fusion Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 14
作者:  Tao, Xian;  Zhang, Dapeng;  Hou, Wei;  Ma, Wenzhi;  Xu, De
Adobe PDF(11203Kb)  |  收藏  |  浏览/下载：380/53  |  提交时间：2021/03/08
Deep learning  defect detection  machine vision  multiple feature fusion  weak scratch inspection  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
Adobe PDF(591Kb)  |  收藏  |  浏览/下载：553/146  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning