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Learning Multi-Resolution Features for Unsupervised Anomaly Localization on Industrial Textured Surfaces 期刊论文
IEEE Transactions on Artificial Intelligence, 2024, 页码: 1-13
作者:  Tao X(陶显);  Shaohua Yan;  Xinyi Gong;  Chandranath Adak
Adobe PDF(6034Kb)  |  收藏  |  浏览/下载：11/4  |  提交时间：2024/06/04
Investigating Shift Equivalence of Convolutional Neural Networks in Industrial Defect Segmentation 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 页码: 1-17
作者:  Qu Z(屈震);  Tao X(陶显);  Shen F(沈飞);  Zhang ZT(张正涛);  Li T(李涛)
Adobe PDF(2869Kb)  |  收藏  |  浏览/下载：7/3  |  提交时间：2024/06/04
A pixel-level deep segmentation network for automatic defect detection 期刊论文
EXPERT SYSTEMS WITH APPLICATIONS, 2023, 卷号: 215, 页码: 11
作者:  Yang, Lei;  Xu, Shuai;  Fan, Junfeng;  Li, En;  Liu, Yanhong
收藏  |  浏览/下载：350/0  |  提交时间：2023/02/22
Defect detection  Deep convolutional neural network  U-shape network  ConvLSTM network  
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载：252/0  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Cross-domain few-shot learning approach for lithium-ion battery surface defects classification using an improved siamese network 期刊论文
IEEE SENSORS JOURNAL, 2022, 页码: 1-1
作者:  Wu, Ke;  Tan, Jie;  Liu, Cheng Bao
Adobe PDF(5175Kb)  |  收藏  |  浏览/下载：331/122  |  提交时间：2022/06/14
Few-shot Learning  3D measurement  defect detection  image classification  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：248/58  |  提交时间：2022/03/03
缺陷检测  
Industrial WeakScratches Inspection Based on Multi-Feature Fusion Network 期刊论文
IEEE Transaction on Instrumentation and Measurement, 2020, 期号: 1, 页码: 1-14
作者:  Tao Xian;  Zhang DP(张大朋);  Hou wei;  Ma wenzhi;  Xu De
浏览  |  Adobe PDF(5789Kb)  |  收藏  |  浏览/下载：269/67  |  提交时间：2020/10/20
Weak scratch inspection, Defect Detection, MultipleFeatureFusion,DeepLearning,MachineVision  
Wire Defect Recognition of Spring-Wire Socket Using Multitask Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 卷号: 8, 期号: 4, 页码: 689-698
作者:  Tao, Xian;  Wang, Zihao;  Zhang, Zhengtao;  Zhang, Dapeng;  Xu, De;  Gong, Xinyi;  Zhang, Lei
浏览  |  Adobe PDF(4279Kb)  |  收藏  |  浏览/下载：506/193  |  提交时间：2018/10/02
Convolutional Neural Network (Cnn)  Defect Recognition  Machine Vision  Multitask Learning  Spring-wire Sockets  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：553/146  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning