CASIA OpenIR
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Wire Defect Recognition of Spring-Wire Socket Using Multitask Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 卷号: 8, 期号: 4, 页码: 689-698
作者:  Tao, Xian;  Wang, Zihao;  Zhang, Zhengtao;  Zhang, Dapeng;  Xu, De;  Gong, Xinyi;  Zhang, Lei
浏览  |  Adobe PDF(4279Kb)  |  收藏  |  浏览/下载:494/191  |  提交时间:2018/10/02
Convolutional Neural Network (Cnn)  Defect Recognition  Machine Vision  Multitask Learning  Spring-wire Sockets  
Surface flaws detection algorithms for large aperture optical element 会议论文
, 北京, 2015.08.22-2015.08.24
作者:  Zhang Zheng-Tao;  Tao Xian;  Xu De;  Tao X(陶显)
浏览  |  Adobe PDF(1794Kb)  |  收藏  |  浏览/下载:285/66  |  提交时间:2018/01/04
The Development and Prospect of Surface Defect Detection Based on Vision Measurement Method 会议论文
, 中国桂林, 2016.05.12-2016.05.15
作者:  Yuan LX(袁伦喜);  Zhang ZT(张正涛);  Tao X(陶显)
浏览  |  Adobe PDF(657Kb)  |  收藏  |  浏览/下载:721/296  |  提交时间:2017/05/10
Defect Detect  Vision Measurement  
Weak scratch detection and defect classification methods for a large-aperture optical element 期刊论文
OPTICS COMMUNICATIONS, 2017, 卷号: 387, 期号: 0, 页码: 390-400
作者:  Tao, Xian;  Xu, De;  Zhang, Zheng-Tao;  Zhang, Feng;  Liu, Xi-Long;  Zhang, Da-Peng
浏览  |  Adobe PDF(1478Kb)  |  收藏  |  浏览/下载:1009/469  |  提交时间:2017/02/14
Optical Inspection  Weak Scratches  Surface Defects Classification  Large-aperture Optical Element  
Development of detection techniques of surface defects for large aperture optical elements based on machine vision 会议论文
第33届中国控制会议, 中国南京, 2014年7月28-30日
作者:  Tao X(陶显);  Zhang ZT(张正涛);  Zhang F(张峰);  Shi YL(史亚莉);  Xu D(徐德)
浏览  |  Adobe PDF(619Kb)  |  收藏  |  浏览/下载:505/194  |  提交时间:2016/06/20
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载:541/144  |  提交时间:2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning