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Investigating Shift Equivalence of Convolutional Neural Networks in Industrial Defect Segmentation 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 页码: 1-17
作者:  Qu Z(屈震);  Tao X(陶显);  Shen F(沈飞);  Zhang ZT(张正涛);  Li T(李涛)
Adobe PDF(2869Kb)  |  收藏  |  浏览/下载：22/8  |  提交时间：2024/06/04
Toward a Fast and Robust MI-BCI: Online Adaptation of Stimulus Paradigm and Classification Model 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2024, 卷号: 73, 页码: 12
作者:  Wang, Jiaxing;  Wang, Weiqun;  Su, Jianqiang;  Wang, Yihan;  Hou, Zeng-Guang
Adobe PDF(1810Kb)  |  收藏  |  浏览/下载：51/5  |  提交时间：2024/05/30
Brain-computer interface (BCI)  classification model adaption  information transfer rate (ITR)  motor imagery (MI) duration  stimulus paradigm adjustment  
Online Progressive Instance-Balanced Sampling for Weakly Supervised Vibration Damper Detection 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 14
作者:  Chen, Minghao;  Tian, Yunong;  Li, Zhishuo;  Li, En;  Liang, Zize
Adobe PDF(4445Kb)  |  收藏  |  浏览/下载：114/11  |  提交时间：2023/11/17
Shock absorbers  Vibrations  Object detection  Proposals  Training  Sampling methods  Convolutional neural networks  Instance balance  multiple instance learning (MIL)  progressive sampling  vibration damper detection  weakly supervised object detection (WSOD)  
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载：262/1  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Generalization on Unseen Domains via Model-Agnostic Learning for Intelligent Fault Diagnosis 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 11
作者:  Wang, Huanjie;  Bai, Xiwei;  Wang, Sihan;  Tan, Jie;  Liu, Chengbao
Adobe PDF(3477Kb)  |  收藏  |  浏览/下载：300/55  |  提交时间：2022/06/06
Data-driven fault diagnosis  Domain generalization  Model-agnostic learning  Rolling bearing  
Self-Supervised Contact Geometry Learning by GelStereo Visuotactile Sensing 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 9
作者:  Cui, Shaowei;  Wang, Rui;  Hu, Jingyi;  Zhang, Chaofan;  Chen, Lipeng;  Wang, Shuo
Adobe PDF(1925Kb)  |  收藏  |  浏览/下载：609/309  |  提交时间：2022/06/06
Geometry  Sensors  Three-dimensional displays  Estimation  Image reconstruction  Tactile sensors  Color  Depth estimation  robotic sensing systems  self-supervised learning  tactile sensors  
Design and Hysteresis Modeling of a Miniaturized Elastomer-Based Clutched Torque Sensor 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 9
作者:  Sun, Ning;  Cheng, Long;  Xia, Xiuze
Adobe PDF(1608Kb)  |  收藏  |  浏览/下载：407/107  |  提交时间：2022/06/06
Clutch  elastic torque sensor  hysteresis modeling  mechanical design  rubber spring  
Hardware-Oriented Algorithm for High-Speed Laser Centerline Extraction Based on Hessian Matrix 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 14
作者:  Li, Zhikai;  Ma, Liping;  Long, Xianlei;  Chen, Yunze;  Deng, Haitao;  Yan, Fengxia;  Gu, Qingyi
Adobe PDF(3764Kb)  |  收藏  |  浏览/下载：306/45  |  提交时间：2022/03/17
Hardware image processing  Hessian matrix  high-speed vision  laser centerline extraction  line-section 3-D reconstruction  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：254/59  |  提交时间：2022/03/03
缺陷检测  
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：302/66  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection