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Investigating Shift Equivalence of Convolutional Neural Networks in Industrial Defect Segmentation 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 页码: 1-17
作者:  Qu Z(屈震);  Tao X(陶显);  Shen F(沈飞);  Zhang ZT(张正涛);  Li T(李涛)
Adobe PDF(2869Kb)  |  收藏  |  浏览/下载：6/3  |  提交时间：2024/06/04
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
Adobe PDF(7056Kb)  |  收藏  |  浏览/下载：252/0  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
Hardware-Oriented Algorithm for High-Speed Laser Centerline Extraction Based on Hessian Matrix 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 14
作者:  Li, Zhikai;  Ma, Liping;  Long, Xianlei;  Chen, Yunze;  Deng, Haitao;  Yan, Fengxia;  Gu, Qingyi
Adobe PDF(3764Kb)  |  收藏  |  浏览/下载：297/43  |  提交时间：2022/03/17
Hardware image processing  Hessian matrix  high-speed vision  laser centerline extraction  line-section 3-D reconstruction  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：246/57  |  提交时间：2022/03/03
缺陷检测  
Combining Prior Knowledge With CNN for Weak Scratch Inspection of Optical Components 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 11
作者:  Hou, Wei;  Tao, Xian;  Xu, De
Adobe PDF(6798Kb)  |  收藏  |  浏览/下载：393/133  |  提交时间：2021/03/08
Convolutional neural network (CNN)  direction-sensitive convolution (DSC)  local maximum index (LMI)  optical component  weak scratch inspection  
Industrial Weak Scratches Inspection Based on Multifeature Fusion Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 14
作者:  Tao, Xian;  Zhang, Dapeng;  Hou, Wei;  Ma, Wenzhi;  Xu, De
Adobe PDF(11203Kb)  |  收藏  |  浏览/下载：380/53  |  提交时间：2021/03/08
Deep learning  defect detection  machine vision  multiple feature fusion  weak scratch inspection  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：357/74  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing  
An Ultrahigh-Speed Object Detection Method With Projection-Based Position Compensation 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 7, 页码: 4796-4806
作者:  Li, Jianquan;  Long, Xianlei;  Xu, De;  Gu, Qingyi;  Ishii, Idaku
Adobe PDF(6758Kb)  |  收藏  |  浏览/下载：289/35  |  提交时间：2020/08/03
Field-programmable gate array (FPGA)  hardware implementation  histogram of oriented gradient (HOG)  object detection  pixel projection  ultrahigh-speed vision  
Robust Visual Detection-Learning-Tracking Framework for Autonomous Aerial Refueling of UAVs 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2016, 卷号: 65, 期号: 3, 页码: 510-521
作者:  Yin, Yingjie;  Wang, Xingang;  Xu, De;  Liu, Fangfang;  Wang, Yinglu;  Wu, Wenqi
Adobe PDF(2875Kb)  |  收藏  |  浏览/下载：436/107  |  提交时间：2016/06/14
Aerial Refueling  Linear Support Vector Machine (Svm)  Structured Svm  Unmanned Aerial Vehicles (Uavs)  Visual Detection  Visual Tracking  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：553/146  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning