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Industrial Weak Scratches Inspection Based on Multifeature Fusion Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 14
作者:  Tao, Xian;  Zhang, Dapeng;  Hou, Wei;  Ma, Wenzhi;  Xu, De
Adobe PDF(11203Kb)  |  收藏  |  浏览/下载：349/48  |  提交时间：2021/03/08
Deep learning  defect detection  machine vision  multiple feature fusion  weak scratch inspection  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：327/68  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing  
Robust Visual Detection and Tracking Strategies for Autonomous Aerial Refueling of UAVs 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 卷号: 68, 期号: 12, 页码: 4640-4652
作者:  Sun, Siyang;  Yin, Yingjie;  Wang, Xingang;  Xu, De
浏览  |  Adobe PDF(11285Kb)  |  收藏  |  浏览/下载：276/57  |  提交时间：2020/03/30
Target tracking  Feature extraction  Object detection  Search problems  Proposals  Visualization  Detectors  Autonomous aerial refueling (AAR)  deep learning  object detection  object tracking  reinforcement learning  
Surface Defects Detection Based on Adaptive Multiscale Image Collection and Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 卷号: 68, 期号: 12, 页码: 4787-4797
作者:  Sun, Jia;  Wang, Peng;  Luo, Yong-Kang;  Li, Wanyi
浏览  |  Adobe PDF(4530Kb)  |  收藏  |  浏览/下载：254/79  |  提交时间：2020/03/30
Inspection  Surface treatment  Training  Metals  Task analysis  Instruments  Visualization  Adaptive multiscale image collection (AMIC)  convolutional neural networks (CNNs)  image classification  surface inspection  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：529/140  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning