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Development, Calibration, and Image Processing of Underwater Structured Light Vision System: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 卷号: 72, 页码: 18
作者:  Fan, Junfeng;  Wang, Xuan;  Zhou, Chao;  Ou, Yaming;  Jing, Fengshui;  Hou, Zengguang
收藏  |  浏览/下载：75/0  |  提交时间：2023/11/17
Machine vision  Measurement by laser beam  Three-dimensional displays  Cameras  Sea measurements  Calibration  Image processing  system calibration  system development  underwater structured light vision system  
Deep Learning for Unsupervised Anomaly Localization in Industrial Images: A Survey 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 21
作者:  Tao, Xian;  Gong, Xinyi;  Zhang, Xin;  Yan, Shaohua;  Adak, Chandranath
收藏  |  浏览/下载：233/0  |  提交时间：2022/09/19
Anomaly localization (AL)  deep learning  industrial inspection  literature survey  unsupervised learning  
An Automatic Deep Segmentation Network for Pixel-Level Welding Defect Detection 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2022, 卷号: 71, 页码: 10
作者:  Yang, Lei;  Song, Shouan;  Fan, Junfeng;  Huo, Benyan;  Li, En;  Liu, Yanhong
收藏  |  浏览/下载：191/0  |  提交时间：2022/06/06
Welding  Feature extraction  Image segmentation  Inspection  X-ray imaging  Manufacturing  Task analysis  Attention model  convolutional long short-term memory (ConvLSTM)  defect detection  feature fusion  hybrid loss  image segmentation  
Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：235/56  |  提交时间：2022/03/03
缺陷检测  
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：278/62  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection  
ACR-Net: Attention Integrated and Cross-Spatial Feature Fused Rotation Network for Tubular Solder Joint Detection 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 12
作者:  Zhou, Chenlin;  Li, Daheng;  Wang, Peng;  Sun, Jia;  Huang, Yikun;  Li, Wanyi
收藏  |  浏览/下载：170/0  |  提交时间：2021/11/03
Deep learning  defect detection  object detection  tubular solder joint detection  
Combining Prior Knowledge With CNN for Weak Scratch Inspection of Optical Components 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 11
作者:  Hou, Wei;  Tao, Xian;  Xu, De
Adobe PDF(6798Kb)  |  收藏  |  浏览/下载：377/130  |  提交时间：2021/03/08
Convolutional neural network (CNN)  direction-sensitive convolution (DSC)  local maximum index (LMI)  optical component  weak scratch inspection  
Industrial Weak Scratches Inspection Based on Multifeature Fusion Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 14
作者:  Tao, Xian;  Zhang, Dapeng;  Hou, Wei;  Ma, Wenzhi;  Xu, De
Adobe PDF(11203Kb)  |  收藏  |  浏览/下载：361/50  |  提交时间：2021/03/08
Deep learning  defect detection  machine vision  multiple feature fusion  weak scratch inspection  
A Review on State-of-the-Art Power Line Inspection Techniques 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 12, 页码: 9350-9365
作者:  Yang, Lei;  Fan, Junfeng;  Liu, Yanhong;  Li, En;  Peng, Jinzhu;  Liang, Zize
收藏  |  浏览/下载：213/0  |  提交时间：2021/01/06
Inspection  Poles and towers  Task analysis  Insulators  Smart grids  Feature extraction  Inspection methods  inspection platforms  inspection sensors  inspection task  power line inspection  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：339/71  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing