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Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 期号: 1, 页码: 1-10
作者:  Tao X(陶显);  Ma WZ(马文治);  Lu ZF(逯正峰);  Hou ZX(侯占新)
Adobe PDF(3208Kb)  |  收藏  |  浏览/下载：237/56  |  提交时间：2022/03/03
缺陷检测  
An Underwater Micro Cable-Driven Pan-Tilt Binocular Vision System With Spherical Refraction Calibration 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Qiu, Changlin;  Wu, Zhengxing;  Kong, Shihan;  Yu, Junzhi
Adobe PDF(2362Kb)  |  收藏  |  浏览/下载：158/0  |  提交时间：2021/11/04
Pan-tilt camera  target tracking  underwater measurement  underwater refraction correction  
A Calibration and 3-D Measurement Method for an Active Vision System With Symmetric Yawing Cameras 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Xu, De;  Zhang, Di;  Liu, Xilong;  Ma, Liping
Adobe PDF(2707Kb)  |  收藏  |  浏览/下载：300/55  |  提交时间：2021/11/03
3-D measurement  active vision  calibration  stereo vision  symmetric yawing system  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：341/72  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing  
A Robust Detection Method of Control Points for Calibration and Measurement With Defocused Images 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2017, 卷号: 66, 期号: 10, 页码: 2725-2735
作者:  Ding, Wendong;  Liu, Xilong;  Xu, De;  Zhang, Dapeng;  Zhang, Zhengtao
浏览  |  Adobe PDF(2118Kb)  |  收藏  |  浏览/下载：499/120  |  提交时间：2018/01/04
Camera Calibration  Control Point Detection  Defocused Image  Point Spread Function  Vision Measurement  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：541/144  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning