中文版 | English

在结果中检索

CASIA OpenIR
（本次检索基于用户作品认领结果）

浏览/检索结果: 共11条，第1-10条 帮助

限定条件            
已选(0)清除 条数/页：   排序方式：
A Novel Pixel-Wise Defect Inspection Method Based on Stable Background Reconstruction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2021, 卷号: 70, 页码: 13
作者:  Lv, Chengkan;  Shen, Fei;  Zhang, Zhengtao;  Xu, De;  He, Yonghao
Adobe PDF(4910Kb)  |  收藏  |  浏览/下载：262/59  |  提交时间：2021/11/03
Anomaly detection  autoencoder  background reconstruction  defect inspection  
CADN: A weakly supervised learning-based category-aware object detection network for surface defect detection 期刊论文
Pattern Recognition, 2020, 期号: 109, 页码: 1-9
作者:  Jiabin, Zhang;  Hu, Su;  Wei, Zou;  Xinyi, Gong;  Zhengtao, Zhang;  Fei, Shen
Adobe PDF(1838Kb)  |  收藏  |  浏览/下载：184/31  |  提交时间：2021/06/17
Weakly supervised learning  Automated surface inspection  Defect detection  Knowledge distillation  
Visual Defect Inspection for Deep-Aperture Components With Coarse-to-Fine Contour Extraction 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2020, 卷号: 69, 期号: 6, 页码: 3262-3274
作者:  Gong, Xinyi;  Su, Hu;  Xu, De;  Zhang, Jiabin;  Zhang, Lei;  Zhang, Zhengtao
浏览  |  Adobe PDF(1324Kb)  |  收藏  |  浏览/下载：322/68  |  提交时间：2020/08/03
Coarse-fine positioning  deep-hole component  defect inspection  edge grouping  image processing  
Quality Inspection Based on Quadrangular Object Detection for Deep Aperture Component 期刊论文
IEEE Transactions on Systems, Man, and Cybernetics: Systems, 2019, 卷号: Early Access, 期号: Early Access, 页码: 0
作者:  Zhang JB(张家斌);  Zhang ZT(张正涛);  Su H(苏虎);  Zou W(邹伟);  Gong XY(宫新一);  Zhang F(张峰)
Adobe PDF(3914Kb)  |  收藏  |  浏览/下载：233/46  |  提交时间：2021/05/27
Quality Inspection  Quadrangular Object Detection  
A Fast Surface Defect Detection Method Based on Background Reconstruction 期刊论文
INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING, 2019, 卷号: 21, 期号: 3, 页码: 363-375
作者:  Lv, Chengkan;  Zhang, Zhengtao;  Shen, Fei;  Zhang, Feng;  Su, Hu
Adobe PDF(2471Kb)  |  收藏  |  浏览/下载：336/45  |  提交时间：2020/03/30
Defect detection  Unsupervised learning  Background reconstruction  
Contour Extraction and Quality Inspection for Inner Structure of Deep Hole Components 期刊论文
IEEE Transactions on Components, Packaging and Manufacturing Technology, 2019, 卷号: 9, 期号: 3, 页码: 575-585
作者:  Gong XY(宫新一);  Hu Su;  De Xu;  Huabin Yang;  Zhengtao Zhang;  Lei Zhang
浏览  |  Adobe PDF(1336Kb)  |  收藏  |  浏览/下载：346/92  |  提交时间：2019/05/08
Brownian Motion, Edge Grouping, Contour Extraction, Deep-hole Component  
Wire Defect Recognition of Spring-Wire Socket Using Multitask Convolutional Neural Networks 期刊论文
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY, 2018, 卷号: 8, 期号: 4, 页码: 689-698
作者:  Tao, Xian;  Wang, Zihao;  Zhang, Zhengtao;  Zhang, Dapeng;  Xu, De;  Gong, Xinyi;  Zhang, Lei
浏览  |  Adobe PDF(4279Kb)  |  收藏  |  浏览/下载：485/187  |  提交时间：2018/10/02
Convolutional Neural Network (Cnn)  Defect Recognition  Machine Vision  Multitask Learning  Spring-wire Sockets  
A Robust Detection Method of Control Points for Calibration and Measurement With Defocused Images 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2017, 卷号: 66, 期号: 10, 页码: 2725-2735
作者:  Ding, Wendong;  Liu, Xilong;  Xu, De;  Zhang, Dapeng;  Zhang, Zhengtao
浏览  |  Adobe PDF(2118Kb)  |  收藏  |  浏览/下载：487/112  |  提交时间：2018/01/04
Camera Calibration  Control Point Detection  Defocused Image  Point Spread Function  Vision Measurement  
Weak scratch detection and defect classification methods for a large-aperture optical element 期刊论文
OPTICS COMMUNICATIONS, 2017, 卷号: 387, 期号: 0, 页码: 390-400
作者:  Tao, Xian;  Xu, De;  Zhang, Zheng-Tao;  Zhang, Feng;  Liu, Xi-Long;  Zhang, Da-Peng
浏览  |  Adobe PDF(1478Kb)  |  收藏  |  浏览/下载：995/466  |  提交时间：2017/02/14
Optical Inspection  Weak Scratches  Surface Defects Classification  Large-aperture Optical Element  
A Novel and Effective Surface Flaw Inspection Instrument for Large-Aperture Optical Elements 期刊论文
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2015, 卷号: 64, 期号: 9, 页码: 2530-2540
作者:  Tao, Xian;  Zhang, Zhengtao;  Zhang, Feng;  Xu, De
浏览  |  Adobe PDF(591Kb)  |  收藏  |  浏览/下载：521/140  |  提交时间：2015/09/23
Bright-field Imaging System (Bfis)  Dark-field Imaging System (Dfis)  Flaw Inspection  Image Processing  Large-aperture Optical Element  Measurement  Path Planning